Hui Zhong1, Nan Liu2, Zhihui Yang3,4, Jie Lin1,5,*, Zhijie Wang6, Shengchun Qu6, and Peng Jin1,5,*
哈工大金鹏教授、林杰副教授
1 School of Instrumentation Science and Engineering, Harbin 150001, China
2 School of Mechanical and Electric Engineering, Soochow University, Suzhou 215006, China
3 School of Optics and Photonics, Beijing Institute of Technology, Beijng 100081, China
4 Science and Technology on Electromagnetic Scattering Laboratory, Beijng 100854, China
5 Key Laboratory of Micro-systems and Micro-structures Manufacturing (Harbin Institute of Technology), Ministry of Education, Harbin 150080, China
6 Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
