Quantitative phase imaging based on Fourier ptychographic microscopy: advances, applications, and perspectives
Chuanjian Zheng,a,b Tianyu Wang,c Zhan Li,a,b Ruiqing Sun,d Delong Yang,a,b Sen Wang,c Binjie Ouyang,c Fei Liu,c Meng Xiang,c,* Qun Hao,a,b,e,* and Shaohui Zhanga,b,*
北京理工大学张韶辉副教授、郝群教授，西安电子科技大学相萌副教授
a School of Optics and Photonics, Beijing Institute of Technology, Beijing, China
b National Key Laboratory on Near-Surface Detection, Beijing, China
c School of Optoelectronic Engineering, Xidian University, Xi’an, China
d School of Computer Science and Technology, Beijing Institute of Technology, Beijing, China
e Changchun University of Science and Technology, Changchun, China
