Yingjie Ma1, Jingxian Bao1, Mengxuan Liu1, Lixia Zheng2, Haiyong Zhu1, Junliang Liu3, Yakui Dong3, Wei Kong1, Ruikai Xue1, Yi Gu1, Genghua Huang1, Weifeng Sun2, Xue Li1, Haimei Gong1, and Jiaxiong Fang1
中国科学院上海技术物理研究所李雪研究员
1 National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China
2 School of Integrated Circuits, Southeast University, Nanjing, China
3 School of Information Science and Engineering, Shandong University, Jinan, China
