Chengfeng Li1,2,3,4,5,†, Jingyao Zhang1,2,3,4,5,†, Tao He1,2,3,4,5,*, Yuhang Dai1,2,3,4,5, Jingyuan Zhu1,2,3,4,5, Siyu Dong1,2,3,4,5, Zeyong Wei1,2,3,4,5, Yuzhi Shi1,2,3,4,5,*, Hongfei Jiao1,2,3,4,5, Zhanshan Wang1,2,3,4,5, and Xinbin Cheng1,2,3,4,5,*
同济大学程鑫斌教授、施宇智教授、何涛助理教授
1 Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai, 200092 China
2 MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai, 200092 China
3 Shanghai Frontiers Science Center of Digital Optics, Shanghai, 200092 China
4 Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai, 200092 China
5 Shanghai Professional Technical Service Platform for Full-Spectrum and High-Performance Optical Thin Film Devices and Applications, Shanghai, 200092 China
† C.L. and J.Z. contributed equally to this work.
