Chuanshou Wang1,*, Xiaoxing Ke2,3,*, Jianjun Wang4,*, Renrong Liang5, Zhenlin Luo6, Yu Tian1, Di Yi7,
Qintong Zhang8, Jing Wang1, Xiu-Feng Han8, Gustaaf Van Tendeloo2, Long-Qing Chen4,9, Ce-Wen Nan4,
Ramamoorthy Ramesh7 & Jinxing Zhang1
1 Department of Physics, Beijing Normal University, 100875 Beijing, China.
2 EMAT (Electron Microscopy for Materials Science), University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium.
3 Institute of Microstructures and Properties of Advanced Materials, Beijing University of Technology, 100124 Beijing, China.
4 State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University,
100084 Beijing, China.
5 Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University, 100084
Beijing, China.
6 National Synchrotron Radiation Laboratory and CAS Key Laboratory of Materials for Energy Conversion, University of Science and Technology of China, 230026 Hefei, China.
7 Department of Materials Science and Engineering, University of California, 94720 Berkeley, California, USA.
8 Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Science, 100190 Beijing, China. 9 Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania, 16802 Pennsylvania, USA.
* These authors contributed equally to this work.